Makovejev, S.: search on Z-Library

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1

Wide frequency band assessment of 28nm FDSOI technology platform for analogue and RF applications

Makovejev, S., Kazemi Esfeh, B., Barral, V., Planes, N., Haond, M., Flandre, D., Raskin, J.-P., Kilchytska, V.

Journal:

Solid-State Electronics

Year:

2015

Language:

english

File:

PDF, 1.45 MB

english, 2015

2

Ultra-thin body and thin-BOX SOI CMOS technology analog figures of merit

V. Kilchytska, M.K. Md Arshad, S. Makovejev, S. Olsen, F. Andrieu, T. Poiroux, O. Faynot, J.-P. Raskin, D. Flandre

Journal:

Solid-State Electronics

Year:

2012

Language:

english

File:

PDF, 1003 KB

english, 2012

3

RF Extraction of Self-Heating Effects in FinFETs

Makovejev, S., Olsen, S., Raskin, J.

Journal:

IEEE Transactions on Electron Devices

Year:

2011

Language:

english

File:

PDF, 636 KB

english, 2011

4

Impact of self-heating and substrate effects on small-signal output conductance in UTBB SOI MOSFETs

S. Makovejev, J.-P. Raskin, M.K. Md Arshad, D. Flandre, S. Olsen, F. Andrieu, V. Kilchytska

Journal:

Solid-State Electronics

Year:

2012

Language:

english

File:

PDF, 924 KB

english, 2012

5

Comparison of self-heating and its effect on analogue performance in 28nm bulk and FDSOI

Makovejev, S., Planes, N., Haond, M., Flandre, D., Raskin, J.-P., Kilchytska, V.

Journal:

Solid-State Electronics

Year:

2015

Language:

english

File:

PDF, 1.73 MB

english, 2015

6

Time and Frequency Domain Characterization of Transistor Self-Heating

Makovejev, Sergej, Olsen, Sarah H., Kilchytska, Valeriya, Raskin, Jean-Pierre

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 541 KB

english, 2013

7

UTBB SOI MOSFETs analog figures of merit: Effects of ground plane and asymmetric double-gate regime

Md Arshad, M.K., Makovejev, S., Olsen, S., Andrieu, F., Raskin, J.-P., Flandre, D., Kilchytska, V.

Journal:

Solid-State Electronics

Year:

2013

Language:

english

File:

PDF, 1.45 MB

english, 2013

8

Trigate nanowire MOSFETs analog figures of merit

Kilchytska, V., Makovejev, S., Barraud, S., Poiroux, T., Raskin, J.-P., Flandre, D.

Journal:

Solid-State Electronics

Year:

2015

Language:

english

File:

PDF, 1.28 MB

english, 2015

9

RF SOI CMOS technology on 1st and 2nd generation trap-rich high resistivity SOI wafers

Kazemi Esfeh, B., Makovejev, S., Basso, Didier, Desbonnets, Eric, Kilchytska, V., Flandre, D., Raskin, J.-P.

Journal:

Solid-State Electronics

Year:

2016

Language:

english

File:

PDF, 2.92 MB

english, 2016

10

A SPDT RF Switch Small-and Large-signal Characteristics on TR-HR SOI Substrates

Esfeh, B. Kazemi, Rack, M., Makovejev, S., Allibert, F., Raskin, J.-P.

Journal:

IEEE Journal of the Electron Devices Society

Year:

2018

Language:

english

File:

PDF, 759 KB

english, 2018

11

[IEEE 2011 IEEE International SOI Conference - Tempe, AZ, USA (2011.10.3-2011.10.6)] IEEE 2011 International SOI Conference - Comparison of small-signal output conductance frequency dependence in UTBB SOI MOSFETs with and without ground plane

Makovejev, S., Raskin, J.-P., Flandre, D., Olsen, S., Andrieu, F., Poiroux, T., Kilchytska, V.

Year:

2011

Language:

english

File:

PDF, 488 KB

english, 2011

12

[IEEE 2014 15th International Conference on Ultimate Integration on Silicon (ULIS) - Stockholm, Sweden (2014.04.7-2014.04.9)] 2014 15th International Conference on Ultimate Integration on Silicon (ULIS) - Wide frequency band assessment of 28 nm FDSOI technology platform for analogue and RF applications

Makovejev, S., Esfeh, B. Kazemi, Barral, V., Planes, N., Haond, M., Flandre, D., Raskin, J.-P., Kilchytska, V.

Year:

2014

Language:

english

File:

PDF, 1.37 MB

english, 2014

13

[IEEE 2012 IEEE International SOI Conference - Napa, CA, USA (2012.10.1-2012.10.4)] 2012 IEEE International SOI Conference (SOI) - Improvement of high-frequency FinFET performance by fin width engineering

Makovejev, S., Olsen, S. H., Arshad, M. K. Md, Flandre, D., Raskin, J.-P., Kilchytska, V.

Year:

2012

Language:

english

File:

PDF, 953 KB

english, 2012

14

[IEEE 2011 IEEE 11th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF 2011) - Phoenix, AZ (2011.01.17-2011.01.19)] 2011 IEEE 11th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - RF extraction of self-heating effects in FinFETs of various geometries

Makovejev, S, Olsen, S, Raskin, J

Year:

2011

Language:

english

File:

PDF, 299 KB

english, 2011

15

[IEEE 2020 IEEE Latin America Electron Devices Conference (LAEDC) - San Jose, Costa Rica (2020.2.25-2020.2.28)] 2020 IEEE Latin America Electron Devices Conference (LAEDC) - Electrical characterization of advanced MOSFETs towards analog and RF applications

Kilchytska, Valeriya, Makovejev, Sergej, Esfeh, Babak Kazemi, Nyssens, Lucas, Halder, Arka, Raskin, Jean-Pierre, Flandre, Denis

Year:

2020

File:

PDF, 181 KB

2020

16

[IEEE 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Athens, Greece (2017.4.3-2017.4.5)] 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Analog and RF analysis of gate all around silicon nanowire MOSFETs

Liu, Linjie, Han, Qinghua, Makovejev, Sergej, Trellenkamp, Stefan, Raskin, Jean-Pierre, Mantl, Siegfried, Zhao, Qing-Tai

Year:

2017

Language:

english

File:

PDF, 940 KB

english, 2017

17

Assessment of Global Variability in UTBB MOSFETs in Subthreshold Regime

Makovejev, Sergej, Esfeh, Babak, Andrieu, François, Raskin, Jean-Pierre, Flandre, Denis, Kilchytska, Valeriya

Journal:

Journal of Low Power Electronics and Applications

Year:

2014

Language:

english

File:

PDF, 897 KB

english, 2014

18

[IEEE 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Bologna, Italy (2015.1.26-2015.1.28)] EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon - Self-heating in 28 nm bulk and FDSOI

Makovejev, S., Planes, N., Haond, M., Flandre, D., Raskin, J.-P., Kilchytska, V.

Year:

2015

Language:

english

File:

PDF, 1.18 MB

english, 2015

19

[IEEE 2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) (Formerly known as SOI Conference) - Monterey, CA, USA (2013.10.7-2013.10.10)] 2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - Global variability of UTBB MOSFET in subthreshold

Makovejev, S., Esfeh, B. Kazemi, Andrieu, F., Raskin, J.-P., Flandre, D., Kilchytska, V.

Year:

2013

Language:

english

File:

PDF, 543 KB

english, 2013

20

[IEEE ESSDERC 2014 - 44th European Solid State Device Research Conference - Venice Lido, Italy (2014.9.22-2014.9.26)] 2014 44th European Solid State Device Research Conference (ESSDERC) - Variability of UTBB MOSFET analog figures of merit in wide frequency range

Makovejev, S., Esfeh, B. Kazemi, Raskin, J.-P., Kilchytska, V., Flandre, D., Barral, V., Planes, N., Haond, M.

Year:

2014

Language:

english

File:

PDF, 2.71 MB

english, 2014

21

[IEEE 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - Burlingame, CA, USA (2017.10.16-2017.10.19)] 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - A SPDT RF switch small- and large-signal characteristics on TR-HR SOI substrates

Esfeh, B. Kazemi, Makovejev, S., Allibert, F., Raskin, J.-P.

Year:

2017

Language:

english

File:

PDF, 1.04 MB

english, 2017

22

[IEEE 2012 13th International Conference on Ultimate Integration on Silicon (ULIS) - Grenoble, France (2012.03.6-2012.03.7)] 2012 13th International Conference on Ultimate Integration on Silicon (ULIS) - On extraction of self-heating features in UTBB SOI MOSFETs

Makovejev, S., Olsen, S., Andrieu, F., Poiroux, T., Faynot, O., Flandre, D., Raskin, J.-P., Kilchytska, V.

Year:

2012

Language:

english

File:

PDF, 174 KB

english, 2012

23

[IEEE 2011 12th International Conference on Ultimate Integration on Silicon (ULIS) - Cork, Ireland (2011.03.14-2011.03.16)] Ulis 2011 Ultimate Integration on Silicon - Self-heating and substrate effects in ultra-thin body ultra-thin BOX devices

Makovejev, S., Kilchytska, V., Arshad, M. K. Md, Flandre, D., Andrieu, F., Faynot, O., Olsen, S., Raskin, J.-P.

Year:

2011

Language:

english

File:

PDF, 177 KB

english, 2011

24

[IEEE ESSDERC 2013 - 43rd European Solid State Device Research Conference - Bucharest, Romania (2013.09.16-2013.09.20)] 2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - Threshold voltage extraction techniques and temperature effect in context of global variability in UTBB mosfets

Makovejev, S., Esfeh, B. Kazemi, Raskin, J.-P., Flandre, D., Kilchytska, V., Andrieu, F.

Year:

2013

Language:

english

File:

PDF, 598 KB

english, 2013

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